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*Optical and microstructural characterization of nanocrystalline silicon superlattices

Author(s):
Tsybeskov, L.
Grom, G. F.
Krishnan, R.
Fauchet, P. M.
McCaffrey, J. P.
Baribeau, J-M.
Sproule, G. I.
Lockwood, D. J.
Timoshenko, V.
Diener, J.
Heckler, H.
Kovalev, D.
Koch, F.
Blanton, T. N.
9 more
Publication title:
Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
588
Pub. date:
2000
Page(from):
173
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994966 [1558994963]
Language:
English
Call no.:
M23500/588
Type:
Conference Proceedings

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