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Optical emission related to holes confined in p-type ｦﾄ-doped layers in GaAs

Author(s):
Zhao, Q. X.
Willander, M.
Holtz, P. O.
Lu, W.
Dou, H. F.
Shen, S. C.
Li, G.
Jagadish, C.
3 more
Publication title:
Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
588
Pub. date:
2000
Page(from):
123
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994966 [1558994963]
Language:
English
Call no.:
M23500/588
Type:
Conference Proceedings

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