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SURFACE PHOTOVOLTAGE MEASUREMENT OF MINORITY CARRIER DIFFUSION LENGTHS EXCEEDING WAFER THICKNESS: APPLICATION TO IRON MONITORING WITH PART PER QUADILLION SENSITIVITY

Author(s):
Publication title:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
324
Pub. date:
1994
Page(from):
439
Pub. info.:
Pittsburgh: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992238 [1558992235]
Language:
English
Call no.:
M23500/324
Type:
Conference Proceedings

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