THICKNESS MEASUREMENTS AND OPTICAL CHARACTERIZATION OF THIN POLYMER FILMS

THICKNESS MEASUREMENTS AND OPTICAL CHARACTERIZATION OF THIN POLYMER FILMS

Author(s):

Publication title:

Polymer/inorganic interfaces : symposium held April 14-16, 1993, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

304

Pub. Year:

1993

Page(from):

221

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992009 [1558992006]

Language:

English

Call no.:

M23500/304

Type:

Conference Proceedings

Details

TDL ID:	ZA00017535
Series ID:	PA00000011
Conf. info. (Name):	Symposium on polymer/inorganic interfaces
Conf. info. (Number):	1993
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1993.04.14-1993.04.16

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