Blank Cover Image

Electromigration Characterization for Multilevel Metallizations Using Textured AlCu

Author(s):
Publication title:
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
428
Pub. Year:
1996
Page(from):
75
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993310 [1558993312]
Language:
English
Call no.:
M23500/428
Type:
Conference Proceedings

Similar Items:

Ting, Larry M., Dixit, G., Jain, M., Littau, K. A., Tran, H., Chang, M., Sinha, A.

MRS - Materials Research Society

Zhong, Z.W.

SPIE-The International Society for Optical Engineering

Graas, Carole D., Hong, Qi-Zhong, Ting, Larry L.

MRS - Materials Research Society

Korhonen, M. A., Liu, Tao, Brown, D. D., Li, C.-Y.

MRS - Materials Research Society

L.L. Ting, Q.-Z. Hong

Society of Photo-optical Instrumentation Engineers

Mao, W.W., Qi, G.S., Hong, Q.N., Xu, D.Y.

SPIE-The International Society for Optical Engineering

Wilson, S. R., Weston D., Kottke, M.

Materials Research Society

Ho, P.S., Anderson, S.G.H., Yeo, I.S., Hu, C.K.

Electrochemical Society

Fischer, A.H., Zitzelsberger, A.E., Hommel, M., Glasow, A. von

Materials Research Society

Wong, S. Simon, Cho, James S., Kang, Ho K., Ting, C.H.

Materials Research Society

Korhonen, M. A., Brown, D. D., Li, C. -Y., Rathore, H. S.

MRS - Materials Research Society

Schmidbauer,S., Spinler,S., Lehr,M.U., Klotzsche,J., Hahn,J.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12