Lithography on PMMA-DR1 with reflection near-field optical microscopy(R-SNOM)and probe characterization
- Author(s):
- Davy,S. ( Univ.de Franche-Comte )
- Rachard,G.
- Spajer,M.
- Publication title:
- Optical Inspection and Micromeasurements
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2782
- Pub. Year:
- 1996
- Page(from):
- 551
- Page(to):
- 558
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819421685 [0819421685]
- Language:
- English
- Call no.:
- P63600/2782
- Type:
- Conference Proceedings
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