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Scanning probe microscope study of obliquely evaporated SiOx and its indium-tin-oxide underlayer for the alignment of ferroelectric liquid crystals

Author(s):
Publication title:
International Liquid Crystal Workshop on Surface Phenomena
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2731
Pub. Year:
1996
Page(from):
95
Page(to):
99
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421128 [081942112X]
Language:
English
Call no.:
P63600/2731
Type:
Conference Proceedings

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