Blank Cover Image

Characterization of polarization mode dispersion(PMD)effects on G652 optical fibers

Author(s):
Publication title:
Optical network engineering and integrity : 24-25 October 1995, Philadelphia, Pennsylvania
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2611
Pub. Year:
1996
Page(from):
201
Page(to):
207
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819419750 [0819419753]
Language:
English
Call no.:
P63600/2611
Type:
Conference Proceedings

Similar Items:

Lupi,C., Hyon,N., Salomon,L., Normand,G., Ny,R.Le, Tanguy,E., Leduc,D., Auvray,M., Bizeul,J.C., Gouronnec,A., …

SPIE-The International Society for Optical Engineering

Mao, Y.-J., Dang, M.-R., Yang, X.-L.

SPIE-The International Society for Optical Engineering

Y. Shen, M. Liu, Z. Liu

Society of Photo-optical Instrumentation Engineers

Mao, Y.J., Dang, M.G., Yang, X.L.

SPIE-The International Society for Optical Engineering

Eyal,A., Ben-Artzi,M., Shapiro,O., Tur,M.

SPIE-The International Society for Optical Engineering

Wang, M.G., Jian, S.S.

SPIE-The International Society for Optical Engineering

Lesiak, P., Wolinski, T.R.

SPIE - The International Society of Optical Engineering

M.,Tur, A.,Eyal

CNR

Gao, A.M., Xue, M.C., Huang, K., Chen, L.

SPIE-The International Society for Optical Engineering

Steinkamp, A., Vorbeck, S., Voges, E.

SPIE - The International Society of Optical Engineering

Chen,L., Yanez,M., Bao,X., Petersen,B.R.

SPIE-The International Society for Optical Engineering

Liang Z., Xu W., Chen W., Liu S.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12