Blank Cover Image

Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction

Author(s):
Tomov,I.  
Publication title:
Texture and anisotropy of polycrystals : Proceedings of the International Conference on Texture and Anisotropy of Polycrystals, ITAP, Clausthal, Germany, September 22-25, 1997
Title of ser.:
Materials science forum
Ser. no.:
273-275
Pub. date:
1998
Page(from):
145
Page(to):
150
Pub. info.:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498024 [0878498028]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Tomov, I., Adamik, M., Barna, P. B.

Trans Tech Publications

X. Wu, A. Tay

SPIE - The International Society of Optical Engineering

Tomov, I., Yamakov, V.

Trans Tech Publications

Chen,P., Tomov,I.V., Rentzepis,P.M.

SPIE-The International Society for Optical Engineering

Tomov, I.

Trans Tech Publications

Moreau,B., Wagner,F., Gobel,H.

Trans Tech Publications

Tomov,I.

Trans Tech Publications

Fischer,A.H., Schwarzer,R.A.

Trans Tech Publications

Tomov,I.

Trans Tech Publications

Qu,Y., Li,X., Song,X., Zhang,X., Wang,L., Qie,X.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12