Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction

Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction

Author(s):: Tomov,I.
Publication title:: Texture and anisotropy of polycrystals : Proceedings of the International Conference on Texture and Anisotropy of Polycrystals, ITAP, Clausthal, Germany, September 22-25, 1997
Title of ser.:: Materials science forum
Ser. no.:: 273-275
Pub. Year:: 1998
Page(from):: 145
Page(to):: 150
Pub. info.:: Zuerich, Switzerland: Trans Tech Publications
ISSN:: 02555476
ISBN:: 9780878498024 [0878498028]
Language:: English
Call no.:: M23650
Type:: Conference Proceedings

Details

TDL ID:	ZA00017438
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Texture and Anisotropy of Polycrystals
Conf. info. (Number):	1997
Conf. info. (Venue):	Clausthal, Germany
Conf. info. (Date):	1997.09.22-1997.09.25

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