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High resolution surface characterization using STM light emission techniques

Author(s):
Horn,J.
Marx,N.
Weiss,B.L.
Hartnagel,H.L.
Stehle,M.
Bischoff,M.
Pagnia,H.
2 more
Publication title:
Passivation of metals and semiconductors : proceedings of the Seventh International Symposium on Passivity, Passivation of Metals and Semiconductors, Technical University of Clausthal, Germany, August 21-26, 1994
Title of ser.:
Materials science forum
Ser. no.:
185-188
Pub. Year:
1995
Page(from):
145
Page(to):
154
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496921 [0878496920]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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