Blank Cover Image

Calibration results for the AXAF flight contamination monitor

Author(s):
Elsner, R.F. ( NASA Marshall Space Flight Center )
O'Dell, S.L.
Ramsey, B.D.
Tennant, A.F.
Weisskopf, M.C.
Kolodziejczak, J.J.
Swartz, D.A.
Engelhaupt, D.E.
Garmire, G.P.
Nousek, J.A.
Bautz, M.W.
Gaetz, T.J.
Zhao, P.
8 more
Publication title:
X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3444
Pub. date:
1998
Page(from):
177
Page(to):
188
Pub. info.:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819428998 [081942899X]
Language:
English
Call no.:
P63600/3444
Type:
Conference Proceedings

Similar Items:

Swartz, D.A., Elsner, R.F., Kolodziejczak, J.J., O'Dell, S.L., Tennant, A.F., Sulkanen, M.E., Weisskopf, M.C., Edgar, …

SPIE

Ramsey,B.D., Alexander,C.D., Apple,J.A., Benson,C.M., Dietz,K.L., Elsner,R.F., Engelhaupt,D.E., Ghosh,K.K., …

SPIE-The International Society for Optical Engineering

Elsner,R.F., Kolodziejczak,J.J., O'Dell,S.L., Swartz,D.A., Tennant,A.F., Weisskopf,M.C.

SPIE-The International Society for Optical Engineering

Ramsey,B.D., Engelhaupt,D.E., Speegle,C.O., O'Dell,S.L., Austin,R.A., Kolodziejczak,J.J., Weisskopf,M.C.

SPIE - The International Society for Optical Engineering

Elsner,R.F., Kolodziejczak,J.J., O'Dell,S.L., Swartz,D.A., Tennant,A.F., Weisskopf,M.C.

SPIE - The International Society for Optical Engineering

9 Conference Proceedings Development of hard x-ray optics at MSFC

Ramsey, B.D., Elsner, R.F., Engelhaupt, D.E., O'Dell, S.L., Speegle, C.O., Weisskopf, M.C.

SPIE-The International Society for Optical Engineering

Kolodziejczak,J.J., Austin,R.A., Elsner,R.F., O'Dell,S.L., Sulkanen,M.E., Swartz,D.A., Tennant,A.F., Weisskopf,M.C., …

SPIE-The International Society for Optical Engineering

Ramsey,R.D., Alexander,C.D., Apple,J.A., Austin,R.A., Benson,C.M., Dietz,K.L., Elsner,R.F., Engelhaupt,D.E., …

SPIE-The International Society for Optical Engineering

Kellogg,E.M., Cohen,L.M., Edgar,R.J., Evans,I.N., Freeman,M.D., Gaetz,T.J., Jerius,D., McDermott,W.C., McKinnon,P.J., …

SPIE-The International Society for Optical Engineering

11 Conference Proceedings AXAF HXDS germanium solid state detectors

McDermott,W.C., Kellogg,E.M., Wargelin,B.J., Evans,I.N., Vitek,S.A., Tsiang,E.Y., Schwartz,D.A., Edgar,R.J., Kraft,S., …

SPIE-The International Society for Optical Engineering

Ramsey, B.D., Elsner, R.F., Engelhaupt, D., Gubarev, M.V., Kolodziejczak, J.J., O'Dell, S.L., Speegle, C.O., Weisskopf, …

SPIE - The International Society of Optical Engineering

O'Dell,S.L., Bautz,M.W., Jr.,W.C.Blackwell, Butt,Y.M., Cameron,R.A., Elsner,R.F., Gussenhoven,M.S., Kolodziejczak,J.J., …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12