Surface inspection of web materials using the self-organizing map

Surface inspection of web materials using the self-organizing map

Author(s):

Iivarinen, Jukka ( Helsinki University of Technology )
Rauhamaa, Juhani ( ABB Industry Oy )

Publication title:

Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3522

Pub. Year:

1998

Page(from):

96

Page(to):

103

Pub. info.:

Bellingham, Wash., USA: SPIE

ISSN:

0277786X

ISBN:

9780819429834 [081942983X]

Language:

English

Call no.:

P63600/3522

Type:

Conference Proceedings

Details

TDL ID:	ZA00017414
Series ID:	PA00000029
Conf. info. (Name):	Photonics East : Intelligent Robots and Computer Vision
Conf. info. (Number):	1998 : 17th
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1998.11.02-1998.11.03
Subject:	defect classification; defect detection; self-organizing map; surface inspection

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