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MTF measurement of LCDs by a linear CCD imager: I. Monochrome case

Author(s):
  • Kim,T.H. ( Yeungnam Univ.(Korea) )
  • Choe,O.S. ( Yeungnam Univ.(Korea) )
  • Lee,Y.W. ( Korea Research Institute of Standards and Science )
  • Cho,H.M. ( Korea Research Institute of Standards and Science )
  • Lee,I.W. ( Korea Research Institute of Standards and Science )
Publication title:
Optical manufacturing and testing II : 27-29 July 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3134
Pub. Year:
1997
Page(from):
526
Page(to):
531
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425560 [0819425567]
Language:
English
Call no.:
P63600/3134
Type:
Conference Proceedings

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