Using advanced diagnostics to detect subsurface damage in sapphire

Author(s):

Black,D.R. ( National Institute of Standards and Technology )

Braun,L.M. ( National Institute of Standards and Technology )

Burdette,H. ( National Institute of Standards and Technology )

Evans,C.J. ( National Institute of Standards and Technology )

Hockey,B.J. ( National Institute of Standards and Technology )

Polvani,R.S. ( National Institute of Standards and Technology )

White,G.S. ( National Institute of Standards and Technology )

2 more

Publication title:

Optical manufacturing and testing II : 27-29 July 1997, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3134

Pub. Year:

1997

Page(from):

272

Page(to):

283

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425560 [0819425567]

Language:

English

Call no.:

P63600/3134

Type:

Conference Proceedings