Classification of thermally condition-monitored components using statistical and neural network techniques

Classification of thermally condition-monitored components using statistical and neural network techniques

Author(s):

Moja,N.T. ( Eskom Technology Research and Investigations (South Africa) )
Willis,A.J. ( Univ.of the Witwatersrand (South Africa) )

Publication title:

Applications of digital image processing XX : 30 July-1 August 1997, San Diego, CA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3164

Pub. Year:

1997

Page(from):

573

Page(to):

581

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425867 [0819425869]

Language:

English

Call no.:

P63600/3164

Type:

Conference Proceedings

Details

TDL ID:	ZA00017403
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Applications of Digital Image Processing
Conf. info. (Number):	1997 : 20th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.30-1997.08.01

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