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Correlation between crystal defects and properties of CdTe:Ge radiation detectors

Author(s):
Feichuk,P. ( Univ.of Chernivtsi (Ukraine) )
Shcherbak,L. ( Univ.of Chernivtsi (Ukraine) )
Pluta,D. ( Univ.of Chernivtsi (Ukraine) )
Moravec,P. ( Charles Univ.(Czech Requblic) )
Franc,J. ( Charles Univ.(Czech Requblic) )
Belas,E. ( Charles Univ.(Czech Requblic) )
Hoschl,P. ( Charles Univ.(Czech Requblic) )
2 more
Publication title:
Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3182
Pub. Year:
1997
Page(from):
100
Page(to):
106
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426093 [0819426091]
Language:
English
Call no.:
P63600/3182
Type:
Conference Proceedings

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