Blank Cover Image

Damage mechanisms of pico- and femtosecond laser retinal lesions as viewed by electron microscopy

Author(s):
Publication title:
Proceedings of applications of ultrashort-pulse lasers in medicine and biology : 29-30 January 1998, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3255
Pub. date:
1998
Page(from):
77
Page(to):
81
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426949 [0819426946]
Language:
English
Call no.:
P63600/3255
Type:
Conference Proceedings

Similar Items:

Toth,C.A., Winter,K.P., McCall,M.L.Norton, Rockwell,B.A., Cain,C.P.

SPIE - The International Society for Optical Engineering

7 Conference Proceedings Ultrashort-laser-pulse retinal damage

Rockwell,B.A., Roach,W.P., Payne,D.J., Kennedy,P.K., Druessel,J.J., Amnotte,R.E., Eilert,B., Phillips,S.L., …

SPIE-The International Society for Optical Engineering

Thomas,R.J., Noojin,G.D., Stolarski,D.J., Hengst,G.T., Toth,C.A., Roach,W.P., Rockwell,B.A.

SPIE - The International Society for Optical Engineering

Noojin,G.D., Cain,C.P., Toth,C.A., Stolarski,D.J., Rockwell,B.A.

SPIE - The International Society for Optical Engineering

Rockwell,B.A., Toth,C.A., Roach,W.P., Payne,D.J., Hopkins,R.A.,Jr., Kennedy,P.K., Stolarski,D.J., Noojin,G.D., …

SPIE - The International Society for Optical Engineering

Cain,C.P., Toth,C.A., Noojin,G.D., Stolarski,D.J., Payne,D.J., Rockwell,B.A.

SPIE-The International Society for Optical Engineering

Rockwell,B.A., Payne,D.J., Hopkins,R.A., Hammer,D.X., Kennedy,P.K., Amnotte,R.E., Eilert,B., Druessel,J.J., Toth,C.A., …

SPIE-The International Society for Optical Engineering

McCall,M.N., Harkrider,C.J., Deramo,V., Bailey,S.F., Winter,K.P., Rockwell,B.A, Stolarski,D.J., Toth,C.A.

SPIE-The International Society for Optical Engineering

Cain,C.P., Toth,C.A., Noojin,G.D., Stolarski,D.J., Rockwell,B.A.

SPIE-The International Society for Optical Engineering

Cain,C.P., Toth,C.A., DiCarlo,C.D., Noojin,G.D., Amnotte,R.E., Caruthers,V., Rockwell,B.A.

SPIE-The International Society for Optical Engineering

Rockwell,B.A., Toth,C.A., Stolarski,D.J., Noojin,G.D., Kennedy,P.K., Shaver,J.H., Buffington,G.D., Thomas,R.J.

SPIE-The International Society for Optical Engineering

Toth,C.A., Chiu,E.K., Winter,K.P., Cain,C.P., NooJin,G.D., Roach,W.P., Rockwell,B.A.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12