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Near-field optical characterization of visible multiple quantum well semiconductor lasers

Author(s):
Lu,N.H. ( Institute of Physics (Taiwan) )
Tsai,D.P. ( National Chung Cheng Univ.(Taiwan) )
Yeh,F.C. ( Institute of Physics (Taiwan) )
Chang,C.S. ( Institute of Physics (Taiwan) )
Tsong,T.T. ( Institute of Physics (Taiwan) )
Huang,M.F. ( Industrial Technology Research Institute (Taiwan) )
Liu,C.J. ( Industrial Technology Research Institute (Taiwan) )
2 more
Publication title:
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3285
Pub. Year:
1998
Page(from):
59
Page(to):
65
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427243 [0819427241]
Language:
English
Call no.:
P63600/3285
Type:
Conference Proceedings

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