Blank Cover Image

Refinements in practical accuracy factors for resistor-array IR scene projectors

Author(s):
Publication title:
Technologies for synthetic environments : hardware-in-the-loop testing III : 13-15 April 1998, Orlando, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3368
Pub. Year:
1998
Page(from):
237
Page(to):
244
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428172 [0819428175]
Language:
English
Call no.:
P63600/3368
Type:
Conference Proceedings

Similar Items:

Pritchard,A.P., Venables,M.A., Lake,S.P., Gough,D.W.

SPIE-The International Society for Optical Engineering

A.P. Pritchard, S.P. Lake, I.M. Sturland, M.D. Balmond, D.W. Gough

Society of Photo-optical Instrumentation Engineers

Pritchard,A.P., Lake,S.P., Balmond,M.D., Gough,D.W., Venables,M.A., Sturland,I.M., Crisp,G.N., Watkin,S.C.

SPIE-The International Society for Optical Engineering

Venables,M.A., Gough,D.W., Pritchard,A.P.

SPIE - The International Society for Optical Engineering

Pritchard,A.P., Venables,M.A., Gough,D.W.

SPIE-The International Society for Optical Engineering

Pritchard,A.P., Balmond,M.D., Brimecombe,L.A., Lake,S.P., Venables,M.A., Gough,D.W., Hebbron,M.C., Sturland,I.M.

SPIE - The International Society for Optical Engineering

Pritchard,A.P., Balmond,M.D., Lake,S.P., Gough,D.W., Venables,M.A., Sturland,I.M., Hebbron,M.C,, Brimecombe,L.A.

SPIE-The International Society for Optical Engineering

Pritchard,A.P., Venables,M.A., Balmond,M.D.

SPIE-The International Society for Optical Engineering

Venables,M.A., Lake,S.P., Gough,D.W., Pritchard,A.P.

SPIE - The International Society for Optical Engineering

Pritchard,A.P., Balmond,M.D., Venables,M.A., Lake,S.P.

SPIE - The International Society for Optical Engineering

Pritchard,A.P., Lake,S.P., Venables,M.A., Gough,D.W., Hebbron,M.C., Clarke,R.G.

SPIE - The International Society for Optical Engineering

Flynn,D.S., Olson,E.M., Goldsmith Ⅱ,G.C.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12