LETI/LIR's amorphous silicon uncooled microbolometer development
- Author(s):
- Tissot,J.-L. ( LETI/CEA (France) )
- Rothan,F. ( LETI/CEA (France) )
- Vedel,C. ( LETI/CEA (France) )
- Vilain,M. ( LETI/CEA (France) )
- Yon,J.-J. ( LETI/CEA (France) )
- Publication title:
- Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3379
- Pub. Year:
- 1998
- Page(from):
- 139
- Page(to):
- 144
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819428288 [0819428280]
- Language:
- English
- Call no.:
- P63600/3379
- Type:
- Conference Proceedings
Similar Items:
SPIE |
7
Conference Proceedings
Uncooled amorphous silicon 160x120 IRFPA with 25 pm pixel-pitch for large volume applications
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
9
Conference Proceedings
Low-cost amorphous-silicon-based 160x120 uncooled microbolometer 2D array for high-volume applications
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
First demonstration of 25 μm pitch uncooled amorphous silicon microbolometer IRFPA at LETI-LIR
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Low-cost amorphous silicon-based 160x120 uncooled microbolometer 2D array for high-volume applications
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Uncooled amorphous silicon TEC-less1/4 VGA IRFPA with 25 µm pixel-pitch for high volume applications
Society of Photo-optical Instrumentation Engineers |
6
Conference Proceedings
New IRCMOS architecture applied to uncooled microbolometers developed at LETI
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Enhanced amorphous silicon technology for 320×240 microbolometer arrays with a pitch of 35μm
SPIE-The International Society for Optical Engineering |