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Advanced imaging for DNA analysis based on scanning near-field optical/atomic-force microscopy(SNOAM)

Author(s):
Iwabuchi,S. ( Japan Advanced Institute of Science and Technology )
Hashigasako,A.
Morita,Y.
Sakaguchi,T.
Murakami,Y.
Yokoyama,K.
Tamiya,E.
2 more
Publication title:
Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3607
Pub. Year:
1999
Page(from):
102
Page(to):
107
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819430779 [0819430773]
Language:
English
Call no.:
P63600/3607
Type:
Conference Proceedings

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