Optical and Structural Studies of GaN Epilayers

Optical and Structural Studies of GaN Epilayers

Author(s):: Godlewski,M.
Publication title:: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 3975
Pub. Year:: 2000
Vol.:: Part1
Page(from):: 165
Page(to):: 170
Pub. info.:: Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819436016 [0819436011]
Language:: English
Call no.:: P63600/3975
Type:: Conference Proceedings

Details

TDL ID:	ZA00017117
Series ID:	PA00000029
Conf. info. (Name):	International Workshop on the Physics of Semiconductor Devices
Conf. info. (Number):	1999 : 10th
Conf. info. (Venue):	Delhi, India
Conf. info. (Date):	1999.12.14-1999.12.18

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