CHARACTERIZATION OF CONDUCTIVE ANODIC FILAMENT (CAF) BY X-RAY MICROTOMOGRAPHY AND BY SERIAL SECTIONING
- Author(s):
Stock, S. R. Dollar, L. L. Freeman, G. B. Ready, W. J. Turbini, L. J. Elliott, J. C. Anderson, P. Davis, G. R. - Publication title:
- Electronic packaging materials science VII : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 323
- Pub. Year:
- 1994
- Page(from):
- 65
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992221 [1558992227]
- Language:
- English
- Call no.:
- M23500/323
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Analysis of Catastrophic Field Failures Due to Conductive Anodic Filament (CAF) Formation
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Quantitative analysis of packed and compacted granular systems by x-ray microtomography
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
X-ray microtomography of fatigue crack closure as a functin of applied load in Al-Li 2090 T8E41 samples
MRS-Materials Research Society |
MRS - Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
5
Conference Proceedings
Comparison of Crack Geometry Determined With Phase Contrast Radiography and With Microtomography
Materials Research Society |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Scintillator to CCD coupling in x-ray microtomography (Invited Paper) [6318-44]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |