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Quality of bulk CdTe substrates and its relation to intrinsic defects

Author(s):
Meyer, B. K.
Hofmann, D. M.
Stadler, W.
Emanuelsson, P.
Omling, P.
Weigel, E.
Muller-Vogt, G.
Wienecke, F.
Schenk, M.
4 more
Publication title:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
302
Pub. date:
1993
Page(from):
433
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558991989 [1558991980]
Language:
English
Call no.:
M23500/302
Type:
Conference Proceedings

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