Analysis of deep levels in GaAs detector diodes using impedance spectroscopy
- Author(s):
Eiche, C. Fiederle, M. Weese, J. Maier, D. Ebling, D. Ludwig, J. Benz, K. W. - Publication title:
- Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 302
- Pub. Year:
- 1993
- Page(from):
- 375
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991989 [1558991980]
- Language:
- English
- Call no.:
- M23500/302
- Type:
- Conference Proceedings
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