Blank Cover Image

Roughening of Au(111) Surfaces During Ion Beam Erosion: A Scanning Tunneling Microscope and X-ray Diffraction Study

Author(s):
Judy, A.
Murty, M. V. Ramana
Butler, E.
Pomeroy, J.
Cooper, B. H.
Woll, A. R.
Brock, J. D.
Kycia, S.
Headrick, R. L.
4 more
Publication title:
Epitaxial growth - principles and applications : symposium held April 5-8, 1999, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
570
Pub. Year:
1999
Page(from):
61
Pub. info.:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994775 [1558994777]
Language:
English
Call no.:
M23500/570
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Real-Time X-ray Scattering Study of Surface Dynamics on Au(111) During Ar+ Ion Irradiation

Murty, M. V. Ramana, Curcic, T., Judy, A., Cooper, B. H., Woll, A. R., Brock, J. D., Kycia, S., Headrick, R. L.

MRS - Materials Research Society
7 Conference Proceedings STM Analysis of Copper Thin Films Using Hyperthermal Copper Ions

Pomeroy, J.M., Cooper, B.H., Brock, J.D.

Materials Research Society
2 Conference Proceedings Time-Resolved X-Ray Scattering Study of Co Surface Evolution during Low-Energy Ion Irradiation

Malis, O., Pomeroy, J.M., Headrick, R.L., Brock, J.D.

Materials Research Society
8 Conference Proceedings IN-PLANE ASYMMETRIES ON THE Ge(111)-c(2x8) SURFACE MAPPED WITH THE SCANNING TUNNELING MICROSCOPE

Molinas-Mata, P., Zegenhagen, J., Bohringer, M., Takeuchi, N., Selloni, A.

Materials Research Society
3 Conference Proceedings ANALYSIS OF SCANNING TUNNELING MICROSCOPE TOPOGRAPHS OF GRAPHITE SURFACES ROUGHENED BY Ar+ ION BOMBARDMENT

Eklund, Elliott A., Stanley Williams, R., Snyder, Eric J.

Materials Research Society
9 Conference Proceedings KINETICS OF SURFACE ROUGHENING AND SMOOTHING DURING ION SPUTTERING

Chason, E., Mayer, T. M., Howard, A. J.

MRS - Materials Research Society
4 Conference Proceedings Surface X-Ray Scattering and Scanning Tunneling Microscopy Studies at the AU(111) Electrode

Ocko M. B., Magnussen M. O., Wang X. J., Adzic R. R.

Kluwer Academic Publishers
10 Conference Proceedings Phase-sensltive data collection in x-ray crystailography using reference-beam diffraction

Shen,Q., Kycia,S., Dobrianov,I., Pringle,D.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings STM Investigation of Energetic Insertion During Direct Ion Deposition

Pomeroy, Joshua M., Couture, Aaron, Jacobsen, Joachim, Cooper, Barbara H., Sethna, J.P., Brock, Joel D.

Materials Research Society
11 Conference Proceedings Examination of Interface Roughening in Ion Irradiated Cu/Nb Films by Computer Simulation and by X-ray Diffraction

Prtyka, P. J., Averback, R. S., Robinson, I. K., Lee, Y. S., Flynn, C. P., Bellon, P.

MRS - Materials Research Society
6 Conference Proceedings Low Voltage E-Beam Lithography with the Scanning Tunneling Microscope

Marrian C. R. K., Perkins F. K., Brandow S. L., Koloski T. S., Dobisz E. A., Calvert J. M.

Kluwer Academic Publishers
12 Conference Proceedings SCANNING TUNNELING MICROSCOPE WITH A FIELD ION MICROSCOPE

Hashizume, T., Kamiya, I., Hasegawa, Y., Ide, T., Pickering, H.W., Sakurai, T.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12