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The Incorporation and Complex Formation of Ag Acceptors in CdTe

Author(s):
Wolf, H.
Filz, T.
Hamann, J.
Ostheimer, V.
Lany, S.
Wichert, Th.
Deicher, M.
Burchard, A.
Collaboration, The Isolde
4 more
Publication title:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
510
Pub. date:
1998
Page(from):
337
Pub. info.:
Warrendale, Pa: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994164 [1558994165]
Language:
English
Call no.:
M23500/510
Type:
Conference Proceedings

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