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Hydrogenation and Defect Creation in GaAs-Based Devices During High-Density Plasma Processing

Author(s):
Maeda, T.
Lee, J. W.
Abernathy, C. R.
Pearton, S. J.
Ren, F.
Constantine, C.
Shul, R. J.
2 more
Publication title:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
510
Pub. date:
1998
Page(from):
209
Pub. info.:
Warrendale, Pa: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994164 [1558994165]
Language:
English
Call no.:
M23500/510
Type:
Conference Proceedings

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