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Evaluation of GaP States in Hydrogen-Terminated Silicon Surfaces and Ultrathin SiO2/Si Interfaces by Using Photoelectron Yield Spectroscopy

Author(s):
Miyazaki, S.
Tamura, T.
Maruyama, T.
Murakami, H.
Kohno, A.
Hirose, M.
1 more
Publication title:
Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
500
Pub. date:
1998
Page(from):
81
Pub. info.:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994058 [155899405X]
Language:
English
Call no.:
M23500/500
Type:
Conference Proceedings

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