X-ray Absorption Fine Structure Applied to the Study of Systems with Lattice Instabilities

X-ray Absorption Fine Structure Applied to the Study of Systems with Lattice Instabilities

Author(s):

Leon, J. Mustre de

Publication title:

Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

437

Pub. Year:

1996

Page(from):

189

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993402 [1558993401]

Language:

English

Call no.:

M23500/437

Type:

Conference Proceedings

Details

TDL ID:	ZA00017055
Series ID:	PA00000011
Conf. info. (Name):	Symposium on applications of synchrotron radiation techniques to materials science
Conf. info. (Number):	3rd
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1996.04.08-1996.04.12

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