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Studies of Interface Demarcation and Structural Defects in Ga Doped Ge Single Crystals Using Synchrotron White Beam X-ray Topography

Author(s):
Publication title:
Applications of synchrotron radiation techniques to materials science III : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
437
Pub. Year:
1996
Page(from):
107
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993402 [1558993401]
Language:
English
Call no.:
M23500/437
Type:
Conference Proceedings

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