Characterization of Stress and Mosaicity in Homoepitaxial Diamond Films
- Author(s):
- Publication title:
- Diamond for electronic applications
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 416
- Pub. Year:
- 1996
- Page(from):
- 57
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993198 [1558993193]
- Language:
- English
- Call no.:
- M23500/416
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
X-ray Diffraction Analysis of Strain and Mosaic Structure in (001) Oriented Homoepitaxial Diamond Films
MRS - Materials Research Society |
Materials Research Society |
Electrochemical Society |
Society of Photo-optical Instrumentation Engineers |
Electrochemical Society |
10
Conference Proceedings
DEPTH-RESOLVED RESIDUAL STRESS MEASUREMENTS IN HOMOEPITAXIAL DIAMOND FILMS GROWN BY CHEMICAL VAPOR DEPOSmON
Electrochemical Society |
Materials Research Society |
Materials Research Society |
Electrochemical Society |
12
Conference Proceedings
MORPHOLOGIES IN HOMOEPITAXIAL DIAMOND: CORRELATION TO POLYCRYSTALLINE FILMS
Electrochemical Society |