Influence of Ohmic Contacts on Semi-Insulating GaAs Detector Performances
- Author(s):
Castaldini, A. Cavallini, A. Canali, C. Chiossi, C. Papa, C. del Nava, F. Lanzieri, C. - Publication title:
- Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 406
- Pub. Year:
- 1996
- Page(from):
- 431
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993099 [1558993096]
- Language:
- English
- Call no.:
- M23500/406
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
7
Conference Proceedings
ACTIVATION UNIFORMITY DEPENDENCE OF UNDOPED SEMI-INSULATING GaAs ON POST-IMPLANT ANNEALING CONDITIONS
Materials Research Society |
MRS - Materials Research Society |
Trans Tech Publications |
3
Conference Proceedings
Deep Levels Induced by High Fluence Proton Irradiation in Undoped GaAs Diodes
MRS - Materials Research Society |
9
Conference Proceedings
Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers
Trans Tech Publications |
4
Conference Proceedings
Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors
Trans Tech Publications |
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
Trans Tech Publications |
6
Conference Proceedings
SiC X-Ray Detectors for Spectroscopy and Imaging over a Wide Temperature Range
Trans Tech Publications |
Kluwer Academic Publishers |