Double Modulation and Selective Excitation Photoreflectance for Characterizing Highly Luminescent Semiconductor Structures and Samples with Poor Surface Morphology

Double Modulation and Selective Excitation Photoreflectance for Characterizing Highly Luminescent Semiconductor Structures and Samples with Poor Surface Morphology

Author(s):

Publication title:

Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

406

Pub. Year:

1996

Page(from):

229

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993099 [1558993096]

Language:

English

Call no.:

M23500/406

Type:

Conference Proceedings

Details

TDL ID:	ZA00017052
Series ID:	PA00000011
Conf. info. (Name):	Symposium on diagnostic techniques for semiconductor materials processing
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1995.11.27-1995.11.30

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