Blank Cover Image

Scanning Tunneling Microscopy Studies of GaAs1-xPx Single Crystals

Author(s):
Publication title:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
378
Pub. Year:
1995
Page(from):
83
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992818 [1558992812]
Language:
English
Call no.:
M23500/378
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Scanning Tunneling Microscopy of Si Donors in GaAs

Zheng,J.-F., Liu,X., Newman,N., Weber,E.R.

Trans Tech Publications
7 Conference Proceedings THE FILM SYNTHESIS USING MINIATURE PULSED METAL VAPOR VACUUM ARC PLASMA GUNS

Godechot, X., Salmeron, M. B., Ogletree, D. F., Galvin, J. E., MacGill, R. A., Dickinson, M. R., Yu, K. M., Brown, I. G.

Materials Research Society
2 Conference Proceedings ATOMIC SCALE INTERFACE STRUCTURE OF In0.2Ga0.8As/GaAs STRAINED LAYERS STUDIED BY CROSS-SECTIONAL SCANNING TUNNELING MICROSCOPY

Zheng, J. F., Salmeron, M. B., Weber, E. R.

MRS - Materials Research Society
8 Conference Proceedings A SCANNING TUNNELING MICROSCOPY STUDY OF MBE-GROWN GaAs(001)-FACETED SURFACES

Maboudian, R., Bressler-Hill, V., Wang, X.-S., Pond, K., Petroff, P.M., Weinberg, W.H.

Materials Research Society
3 Conference Proceedings Molecular Arrangement and Mechanical Stbility of Self-Assembled Monolayers on Au (111) under Applied Load

Salmeron M., Liu -Y. G., Ogletree F. D.

Kluwer Academic Publishers
9 Conference Proceedings *SCANNING TUNNELING MICROSCOPY STUDIES OF GaAs HETEROEPITAXIAL GROWTH ON Si

Biegelsen, D. K., Bringans, R. D., Northrup, J. E., Swartz, L. E.

Materials Research Society
4 Conference Proceedings Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy

Ogletree F. D., Hu J., Xiao D. X., Morant C., Dai Q., Vollmer R., Carpick R., Salmeron M.

Kluwer Academic Publishers
10 Conference Proceedings Observation of interface band bending on GaAs/AlAs heterostructures by scanning tunneling microscopy

Sarid,D., Yao,X., Workman,R.K., Peterson,C.A., Fallahi,M.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Making, Breaking and Sliding of Nanometer-Scale Contacts

Carpick, R. W., Enachescu, M., Ogletree, D. F., Salmeron, M.

MRS - Materials Research Society
11 Conference Proceedings Scanning photoluminescence microscopy on GaAs/AlGaAs single quantum wire at room temperature

Li,Z.-F., Lu,W., Liu,X., Shen,S.C., Fu,Y., Willander,M., Tan,H.H., Jagadish,C.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Scanning Tunneling Microscopy Studies of Fullerenes

Sakurai,T., Wang,X.-D., Hashizume,T.

Trans Tech Publications
12 Conference Proceedings A STUDY OF THE DEFECT STRUCTURE IN GaAs1-xPx/GaAs AS x<0.25

Aragon, G., Castro, M. J. de, Molina, S. I., Gonzalez, Y., Gonzalez, L., Briones, F., Garcia, R.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12