Investigation of Resistivity Distributions in CdTe Crystals by Time Dependent Charge Measurements (TDCM)
- Author(s):
Eiche, C. Joerger, W. Fiederle, M. Schwarz, R. Salk, M. Ebling, D. G. Benz, K. W. - Publication title:
- Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 378
- Pub. Year:
- 1995
- Page(from):
- 77
- Pub. info.:
- Pittsburgh, PA: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992818 [1558992812]
- Language:
- English
- Call no.:
- M23500/378
- Type:
- Conference Proceedings
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