Blank Cover Image

Photodiffractive Characterization of Growth-Defects in GaAs

Author(s):
Publication title:
Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
378
Pub. date:
1995
Page(from):
59
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992818 [1558992812]
Language:
English
Call no.:
M23500/378
Type:
Conference Proceedings

Similar Items:

Jarasiunas,K., Vaitkus,J., Gaubas,E., Kapturauskas,J., Vasiliauskas,R.

SPIE-The International Society for Optical Engineering

Mizeikis,V., Jarasiunas,K., Gudelis,V., Sodzius,M.

Trans Tech Publications

Mizeikis,V., Jarasiunas,K., Storasta,J., Gudelis.V., Bastiene,L., Sudzius,M.

SPIE-The International Society for Optical Engineering

Kazukauskas, V., Kuprusevicius, E., Vaitkus, J.-V., Smith, K.M.

Trans Tech Publications

Gaubas, E., Jarasiunas, K., Kaniava, A., Vaitkus, J.

MRS - Materials Research Society

Kazukauskas,V., Kuprusevicius,E., Vaitkus,J.V., Smith,K.M., Nenonen,S.A., Owens,A.

SPIE-The International Society for Optical Engineering

Sudzius, M., Gudelis, V., Aleksiejunas, R., Storasta, J., Jarasiunas, K., Cola, A.

SPIE-The International Society for Optical Engineering

Storasta, L., Aleksiejunas, R., Sudzius, M., Kadys, A., Malinauskas, T., Jarasiunas, K., Magnusson, B., Janzen, E.

Trans Tech Publications

Sudzius,M., Bastiene,L., Jarasiunas,K.

SPIE-The International Society for Optical Engineering

Jarasiunas,K., Sudzius,M., Subacius,L., Simkiene,I., Mizeikis,V.

SPIE-The International Society for Optical Engineering

Shastry, S.K., Zemon, S., Armiento, C., Stern, M.B., Levinson, M., Lehman, L., Rothman, M., Dugger, D., Hefter, J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12