Blank Cover Image

VISUALIZING LANGMUIR-BLODGETT FILMS WITH THE ATOMIC FORCE MICROSCOPE

Author(s):
Publication title:
Determining nanoscale physical properties of materials by microscopy and spectroscopy
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
332
Pub. Year:
1994
Page(from):
429
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992313 [1558992316]
Language:
English
Call no.:
M23500/332
Type:
Conference Proceedings

Similar Items:

Meyer E., Overney r., Howald L., BroabecK D., Luthi R., Guntherodt -J. H.

Kluwer Academic Publishers

Schaffer,T.E., Viani,M., Walters,D.A., Drake,B., Runge,E.K., Cleveland,J.P., Wendman,M.A., Hansma,P.K.

SPIE-The International Society for Optical Engineering

Chi F. L., Fuchs H.

Kluwer Academic Publishers

Fryer R. J., McConnell H. C., Hann A. R., Gupta K. S., Eyres L. B.

Kluwer Academic Publishers

Larsen B. N., Bjornholm T., Garnaes J., Larsen J., Schaumburg K.

Kluwer Academic Publishers

Samuelson L., Rahman A. K. M., Clough S., Tripathy S., Hale P. D., Inagaki T., Skotheim T. A., Okamoto Y.

Plenum Press

Lee, D-C., Li, L., Samuelson, L. A., Sandman, D. J.

MRS-Materials Research Society

Samuelson, Lynne A., Kaplan, D.L., Marx, K.A., Miller, P., Galotti, D.M., Kumar, J., Tripathy, S.K.

Materials Research Society

Parikh, Atul N., Wood, Jonathan, Sharma, Ravi, Allara, David L.

American Chemical Society

Orrit M., Bernard J., Mobius D.

Plenum Press

Peltonen, Jouko, Viitala, Tapani

American Chemical Society

Schwartz, H., Krief, P., Becker, J.Y., Shapiro, L., Khodorkovsky, V., Klug, J.T., Kovalev, E., Meshulam, G., Berkovic, …

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12