Photoreflectance spectroscopy of Si surface ヲト doping on GaAs (001)
- Author(s):
- Wan,M. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Liu,X. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Chen,X. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Lu,W. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Shen,S.C. ( Shanghai Institute of Technical Physics (China) and Ctr. for Advanced Studies in Science and Technology of Microstructures (China) )
- Publication title:
- Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3175
- Pub. Year:
- 1998
- Page(from):
- 180
- Page(to):
- 182
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426734 [0819426733]
- Language:
- English
- Call no.:
- P63600/3175
- Type:
- Conference Proceedings
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