Automatic blemish detection in liquid crystal flat panel displays

Automatic blemish detection in liquid crystal flat panel displays

Author(s):

Pratt,W.K. ( Photon Dynamics,Inc. )
Sawkar,S.S. ( Photon Dynamics,Inc. )
O'Reilly,K. ( Photon Dynamics,Inc. )

Publication title:

Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3306

Pub. Year:

1998

Page(from):

2

Page(to):

13

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819427465 [0819427462]

Language:

English

Call no.:

P63600/3306

Type:

Conference Proceedings

Details

TDL ID:	ZA00016922
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Machine Vision Applications in Industrial Inspection
Conf. info. (Number):	1998 : 4th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1998.01.27

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