Dielectric Breakdown Patterns with a Growth Probability Threshold
- Author(s):
- Publication title:
- Random fluctuations and pattern growth : experiments and models
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 157
- Pub. Year:
- 1988
- Page(from):
- 192
- Page(to):
- 192
- Pages:
- 1
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792300724 [0792300726]
- Language:
- English
- Call no.:
- N11482/157
- Type:
- Conference Proceedings
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