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Dielectric Breakdown Patterns with a Growth Probability Threshold

Author(s):
Publication title:
Random fluctuations and pattern growth : experiments and models
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
157
Pub. Year:
1988
Page(from):
192
Page(to):
192
Pages:
1
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792300724 [0792300726]
Language:
English
Call no.:
N11482/157
Type:
Conference Proceedings

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