THERMAL OXIDATION: KINETICS, CHARGES, PHYSICAL MODELS, AND INTERACTION WITH OTHER PROCESSES IN VLSI DEVICES
- Author(s):
- Publication title:
- Process and device simulation for MOS-VLSI circuits
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 62
- Pub. Year:
- 1983
- Page(from):
- 48
- Page(to):
- 87
- Pages:
- 40
- Pub. info.:
- Boston: Martinus Nijhoff Publishers
- ISSN:
- 0168132X
- ISBN:
- 9789024728244 [902472824X]
- Language:
- English
- Call no.:
- N11482/62
- Type:
- Conference Proceedings
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