Blank Cover Image

UNIBERSAL CONDUCTANCE FLUCTUATIONS IN NARROW CHANNEL MOSFETs

Author(s):
Publication title:
Quantum coherence in mesoscopic systems
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
254
Pub. Year:
1991
Page(from):
405
Page(to):
412
Pages:
8
Pub. info.:
New York: Plenum Press
ISBN:
9780306438899 [0306438895]
Language:
English
Call no.:
N11479/254
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Quantized conductance in narrow channel SOI MOSFETs

Ahopelto, J., Prunnila, M., Erdnen, S., Kamp, M., Emmerling, M., Forchel, A., Kristensen, A., Lindelof, P.E., …

Electrochemical Society
7 Conference Proceedings Electromigration and 1/f Noise in Single-Crystalline, Bamboo, and Polycrystalline Al Lines

Homberg, Marc J. C. van den, Alkemade, P. F. A., Verbruggen, A. H., Dirks, A. G., Ochs, E., Radelaar, S.

MRS - Materials Research Society
2 Conference Proceedings COMPARISON BETWEEN l/f NOISE, HIGH-RESOLUTION RESISTOMETRIC, AND LIFETIME ELECTROMIGRATION STUDIES OF Al AND Al(Si)

Kraayeveld, J. R., Verbruggen, A. H., Radelaar, S.

MRS - Materials Research Society
8 Conference Proceedings Single-Crystalline and Bamboo Al Lines Fabricated by Graphoepitaxy: Microstructure and 1/f Noise Measurements

Homberg, Marc J. C. van den, Verbruggen, A. H., Alkemade, P. F. A., Radelaar, S.

MRS - Materials Research Society
3 Conference Proceedings Kinetics of Cu Segregation in Al-Cu(1 at.% Cu) Interconnects Studied by Resistance Measurements

Kalkman, A. J., Verbruggen, A. H., Janssen, G. C. A. M., Radelaar, S.

MRS - Materials Research Society
9 Conference Proceedings Electromigration and 1/f Noise in Single-Crystalline, Bamboo and Polycrystalline Al Lines

Homberg, Marc J. C. van den, Alkemade, P. F. A., Verbruggen, A. H., Dirks, A. G., Ochs, E., Radelaar, S.

MRS - Materials Research Society
4 Conference Proceedings Electromigration and Diffusion in Short Al-Ni-Cr Lines

Jacobs, L. C., Verbruggen, A. H., Kalkman, A. J., Radelaar, S.

MRS - Materials Research Society
10 Conference Proceedings SELECTIVE CHEMICAL VAPOUR DEPOSITION OF TUNGSTEN USING SiH4WF6 CHEMISTRY

van der Jeugd, C.A., Verbruggen, A.H., Leusink, G.J., Janssen, G.C.A.M., Radelaar, S.

Materials Research Society
5 Conference Proceedings Current Dependence of Reversible Electromigration Induced Resistance Changes in Short Al Lines and Interpretation of Irreversible Effects

Verbruggen, A. H., Homberg, M. J. C. van den, Kalkman, A. J., Kraayeveld, J. R., Willemsen, A. W. -J., Radelaar, S.

MRS - Materials Research Society
11 Conference Proceedings Short-channel, narrow channel, and ultra-thin oxide effects in advanced SOI MOSFETs

Zaouia, S., Goktepeli, S., Perera, A.H., Cristoloveanu, S.

Electrochemical Society
6 Conference Proceedings Electromigration in Short Al Lines Studied by High-Resolution Resistance Measurement

Verbruggen, A. H., Homberg, M. J. C. van den, Jacobs, L. C., Kalkman, A. J., Kraayeveld, J. R., Radelaar, S.

MRS - Materials Research Society
12 Conference Proceedings POSITIVE DOMAIN-WALL MAGNETORESISTANCE OF FERROMAGNETIC POINT CONTACTS

Caro, J., Theeuwen, S.J.C.H., Schreurs, K.I., van Gorkom, R.P., Wellock, K.P., Gribov, N.N., Radelaar, S., Kozub, V.I.

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12