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Polarization models for Monte Carlo ray tracing

Author(s):
Publication title:
Optical system design and analysis software : 21-22 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3780
Pub. Year:
1999
Page(from):
148
Page(to):
150
Pub. info.:
Bellingham, Wash.: SPIE: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432667 [0819432660]
Language:
English
Call no.:
P63600/3780
Type:
Conference Proceedings

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