Achieving high-resolution in flat-panel imagers for digital radiography
- Author(s):
Rahn,J.T. ( Xerox Palo Alto Research Ctr. ) Lemmi,F. Lu,J.-P. Mei,P. Street,R.A. Ready,S.E. Ho,J. Apte,R.B. Schuylenbergh,K.Van Lau,R. Weisfield,R.L. Lujan,R. Boyce,J.B. - Publication title:
- Medical applications of penetrating radiation : 22-23 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3770
- Pub. Year:
- 1999
- Page(from):
- 136
- Page(to):
- 145
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432568 [0819432563]
- Language:
- English
- Call no.:
- P63600/3770
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
SPIE - The International Society for Optical Engineering |
9
Conference Proceedings
Laser Processing Of Amorphous Silicon For Polysilicon Devices, Circuits And Flat-Panel Imagers
Materials Research Society |
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Comparative study of Pbl2 and Hgl2 as direct detector materials for high-resolution x-ray image sensors
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Effects Of Buried Insulator-Sensor Interface On The Lateral Conduction Of High Fill Factor a-Si:H Imagers
Materials Research Society |
Materials Research Society |
12
Conference Proceedings
Improved page-size 127-ヲフm-pixel amorphous-silicon image sensor for x-ray diagnostic medical imaging applications
SPIE-The International Society for Optical Engineering |