Blank Cover Image

The Importance Assessment of RDOF in FRF Coupling Analysis,#67

Author(s):
Publication title:
Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3727
Pub. Year:
1999
Vol.:
Part2
Page(from):
1481
Page(to):
1487
Pub. info.:
Bethel, CT: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053646 [091205364X]
Language:
English
Call no.:
P63600/3727
Type:
Conference Proceedings

Similar Items:

Liu,W., Ewins,D.J.

Society for Experimental Mechanics

Liu,W., Ewins,D.J.

Society for Experimental Mechanics

Imregun,M., Ewins,D.J.

SPIE-The International Society for Optical Engineering

M.L.M. Duarte, D.J. Ewins

Society of Photo-optical Instrumentation Engineers

Ferreira,J.V., Ewins,D.J.

SPIE - The International Society for Optical Engineering

Ashory,M.R., Ewins,D.J.

Society for Experimental Mechanics

Ferreira,J.V., Ewins,D.J.

SPIE - The International Society for Optical Engineering

Ferreira,J.V., Ewins,D.J.

Society for Experimental Mechanics

Liu,W., Ewins,D.J.

SPIE-The International Society for Optical Engineering

Ferreira,J.V., Ewins,D.J.

SPIE-The International Society for Optical Engineering

Liu,W., Ewins,D.J.

Society for Experimental Mechanics

12 Conference Proceedings MIFs and MACs in Modal Analysis

Rades, M., Ewins, D.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12