Reliability and degradation mechanisms of high-power diode lasers
- Author(s):
- Jandeleit,J. ( Fraunhofer Institute for Laser Technology )
- Wiedmann,N.
- Loosen,P.
- Poprawe,R.
- Publication title:
- Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3626
- Pub. Year:
- 1999
- Page(from):
- 217
- Page(to):
- 221
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819430960 [081943096X]
- Language:
- English
- Call no.:
- P63600/3626
- Type:
- Conference Proceedings
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