Blank Cover Image

Building assessment with subpixel accuracy using satellite imagery

Author(s):
Publication title:
Visual Data Exploration and Analysis III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2656
Pub. Year:
1996
Page(from):
65
Page(to):
76
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420305 [0819420301]
Language:
English
Call no.:
P63600/2656
Type:
Conference Proceedings

Similar Items:

Sentlinger, G.I., Davenport, M.R., Ardouin, J.P.

SPIE-The International Society for Optical Engineering

H. Meng, Y. Liu, J. Zhang, H. Gong

SPIE - The International Society of Optical Engineering

D. Roque, N. Afonso, A.M. Fonseca, S. Heleno

ESA Communications

Liu,J.-M., Wang,C.-M., Chieu,B.-C., Chang,C.-I, Ren,H., Yang,C.-W.

SPIE - The International Society for Optical Engineering

Zavorin, I., Stone, H.S., Le Moigne, J.

SPIE-The International Society for Optical Engineering

Chang, C.-I, Ren, H., D'Amico, F.M., Jensen, J.O.

SPIE-The International Society for Optical Engineering

Sebastian y Zuniga,J.M., Reinoso,O., Aracil,R., Garcia,D., Torres,F.

SPIE-The International Society for Optical Engineering

Lin, M.-L., Chu, C.-M., Shih, J.-Y., Wang, Q.-B., Chen, C.-W., Wang, S., Tao, Y.-H., Lee, Y.-T.

SPIE - The International Society of Optical Engineering

Dutkiewicz,M., Davenport,M., Rey,M., Boulter,J.F., Blanchard,A.

SPIE-The International Society for Optical Engineering

Zoran, M. A., Zoran, L. F. V.

SPIE - The International Society of Optical Engineering

Watson, M. A., Geatches, R. M., North, P. R. J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12