Adaptive imaging system using image quality metric based on statistical analysis of speckle fields

Adaptive imaging system using image quality metric based on statistical analysis of speckle fields

Author(s):

Kim,D.H. ( Physical Optics Corp. )

Publication title:

Hybrid Image and Signal Processing VII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4044

Pub. Year:

2000

Page(from):

177

Page(to):

186

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819436702 [0819436704]

Language:

English

Call no.:

P63600/4044

Type:

Conference Proceedings

Details

TDL ID:	ZA00016653
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Hybrid Image and Signal Processing
Conf. info. (Number):	2000 : 7th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2000.04.25

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